Researchers from the Korea Institute of Science and Technology (KIST) suggest a new method to inspect OLED emitter materials, using terahertz wave spectroscopy.

OLED inspection with teraherz waves (KIST)

The researchers say that this method can be used to analyze the transmission characteristics of the OLEDs, without any damage to the materials. This is unlike current fluorescence test methods that harm the OLEDs because of the ultraviolet rays which changes the characteristics.

A more accurate inspection method could help developers to improve the performance of OLED materials, as it could help analyze the performance degradation of OLED devices more accurately than current methods.

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