Researchers from the Japanese National Institute of Advanced Industrial Science and Technology (AIST) developed a new method to selectively measure the behavior of specific molecules at the interfaces of organic layers in a multilayered OLED device - while the device is emitting light, and without harming the device. This can be used to study the deterioration of materials and interface in the OLED and enable improving the device's lifetime easier.
The researchers used advanced laser spectroscopic technique to measure the molecular vibrational spectrum at each layer interface. More specifically, they have used sum frequency generation (SFG) spectroscopy. AIST developed a two-color SFG spectroscopy that uses wavelength-tunable lasers.
This research have been performed in collaboration with CEREBA who provided practical OLED device manufacturing and evaluation technologies.